The OMX-SR is optimized for 2D and 3D Structured Illumination Microscopy (SIM) to achieve resolutions ~100nm in XY and ~300nm in the Z. The system is also equipped with RING TIRF, FRAP/Photoactivation, temperature and CO2 control for live cell imaging, and has deconvolution algorithms built into the software.
Capabilities
- Brightfield and DIC Imaging
- 4-color fluorescence imaging
- 3-color fluorescence simultaneous imaging
- Live cell imaging
- RING TIRF
- Deconvolution
- 2D and 3D Structure Illumination Microscopy (SIM)
Objectives:
- Plan ApoN 60X/1.42 Oil
- TIRF Apo 60X/1.49
Equipment Details:
- GE OMX-SR microscope (inverted)
- Three PCO.edge 5.5 15bit sCMOS Cameras (liquid cooled)
- Live imaging stage, with humidity and CO2 control
Light Source:
- Toptica 4 line laser launch
Excitation Wavelengths
- 405nm
- 488nm
- 568nm
- 642nm
Emission Filters:
- 435/31m
- 528/48m
- 609/37m
- 683/40m