The OMX-SR is optimized for 2D and 3D Structured Illumination Microscopy (SIM) to achieve resolutions ~100nm in XY and ~300nm in the Z. The system is also equipped with RING TIRF, FRAP/Photoactivation, temperature and CO2 control for live cell imaging, and has deconvolution algorithms built into the software.


  • Brightfield and DIC Imaging
  • 4-color fluorescence imaging
  • 3-color fluorescence simultaneous imaging
  • Live cell imaging
  • Deconvolution
  • 2D and 3D Structure Illumination Microscopy (SIM)



  • Plan ApoN 60X/1.42 Oil
  • TIRF Apo 60X/1.49


Equipment Details:

  • GE OMX-SR microscope (inverted)
  • Three PCO.edge 5.5 15bit sCMOS Cameras (liquid cooled)
  • Live imaging stage, with humidity and COcontrol

Light Source:

  • Toptica 4 line laser launch


Excitation Wavelengths

  • 405nm
  • 488nm
  • 568nm
  • 642nm

Emission Filters:

  • 435/31m
  • 528/48m
  • 609/37m
  • 683/40m